In profilometer studies where the interface of surface features, patterns, shapes etc., are being evaluated for orientation, it will be useful to quickly identify areas of interest over the entire profile of measurement. By segmenting a surface into significant areas the user can quickly evaluate boundaries, peaks, pits, areas, volumes and many others to understand their functional role in the entire surface profile under study.
Novacam Profilometer system, for metrology and surface roughness inspection
Novacam's 3D Non-Contact Coordinate Measuring Machines are designed with versatility and superior performance in mind:
-Precision (better than 1um)
-Speed (1-30 thousand measurements per second)
Novacam 3D Profilometer Software
The Novacam three dimensional software programs are used with all Novacam Profliometers. The program permits the consumer to define how big the region, or line to be measured, along with the lateral resolution from the measurement.
Novacam's high end Data Acquisition Profilometer Software programs are incorporated with all of MicroCam non-contact profilometers.
Using a fiber-based optical profilometer NASA measures the thickness of liquid nitrogen in cryogenic chambers at its Propulsion Systems lab because these profilometers use fiber-based probes which can withstands the extreme environment, can be located hundreds of meters away from the interferometer and fit in the tight chamber which standard full-field profilometers with a human operator could not. The signal quality stays constant over the distance.
Fractography is the study of features examined on fracture surfaces and has historically been investigated via Microscope or SEM. Microscope being used for macro scale analysis and SEM particularly when it is the nano or microstructure that is vital to the analysis. Both ultimately allowing for the identification of the fracture mechanism type. Although effective, the Microscope clearly has its limitations and the SEM in most cases, other than atomic level analysis, is unpractical for fracture surface measurement and lacks broad use.
Paper surface topography is vital to the intended use and quality of the product. To control paper product quality it will heavily rely upon quantifiable, reproducible and reliable surface measurement. Precise surface measurement and evaluation of a paper product can lead to the best selection of processing and control measures. The Nanovea 3D Non-Contact Profilometer utilize chromatic confocal technology with unmatched capability to measure paper surfaces.
Flatness measurement of electronic parts and assemblies, or PCB’s, has become increasingly critical as geometries become smaller: finer pitches, smaller solder ball volumes, thinner substrates, etc. Additionally, processing temperatures vary and can play a major role in PCB warpage and or planarity defects. As a result, accurate flatness measurement, using a profilometer, has become vitally important to warpage characterization and planarity measurement.
