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 <title>Electromiration</title>
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 <description>&lt;p&gt;In service, an interconnect line carries an intense electric current. The conduction electrons impact metal atoms, and motivate the atoms to diffuse in the direction of electron flow.  The process, known as electromigration, has been the most menacing and persistent threat to interconnect reliability.&lt;/p&gt;
&lt;br class=&quot;clear&quot; /&gt;</description>
 <comments>http://www.imechanica.org/node/4863#comments</comments>
 <category domain="http://www.imechanica.org/taxonomy/term/551">ES 242r</category>
 <category domain="http://www.imechanica.org/taxonomy/term/3500">Evolving Small Structures</category>
 <category domain="http://www.imechanica.org/taxonomy/term/3499">Spring 2004</category>
 <enclosure url="http://www.imechanica.org/files/L12 Electromigration.pdf" length="438018" type="attachment/pdf" />
 <pubDate>Sat, 21 Feb 2009 16:16:45 -0500</pubDate>
 <dc:creator>Zhigang Suo</dc:creator>
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